![]() QuickEdit is available for Windows, MacOS (see the FAQ for MacOS help), Linux and just about any platform that runs a standard version of Java. More tools such as reporting automation, data collection automation and data architecting are available with upgrade to QuickLoad-Central. All graphs can be printed to PDF and PNG files. Histograms, trend charts, scatter plots, box plots, wafer maps, bin and test fail paretos, with a robust set of configurations including outlier removal, up to three levels of grouping, limits drawing, histogram bin selection, wafer map rotation and more. Statistical summariesĬan be seen for a few or all tests, including failure percentages, Cpks, medians, alarms and quartiles. ![]() ![]() Combine final test files from multiple steps or fab wafer sort re-probe sessions into one file for product characterization or to create analysis groups.
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